TY  - JOUR
PB  - American Physical Society
ID  - 10.1103/Physics.2.85
TI  - Reaching a new resolution standard with electron microscopy
JF  - Physics
JA  - Physics
J1  - PHYSICS
VL  - 2
IS  - 
SP  - 85
EP  - 
PY  - 2009/10/12/
UR  - http://link.aps.org/doi/10.1103/Physics.2.85
A1  - Klie, Robert F.
ER  -