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The atomic force microscope, introduced in 1986, provided atomic-scale pictures of surfaces, with few limitations on the type of sample.
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Researchers used a nanoscale tunnel in a silicon chip to measure a flow rate of a few picoliters per minute, which is smaller than any previous observation.
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The properties that characterize topological insulators, such as symmetry protected surface states, also appear in materials with quasiperiodic order.
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