Daniel Rugar is Manager of Nanoscale Studies at the IBM Almaden Research Center, and a Consulting Professor of Applied Physics at Stanford University. He received his B.A. degree in physics from Pomona College and his Ph.D. in applied physics from Stanford University. He joined IBM in 1984 and has made numerous contributions to the field of scanning probe microscopy, especially for atomic force microscopy, magnetic force microscopy, and nanoscale magnetic resonance imaging. He recently shared the Günther Laukien Prize for the development of magnetic resonance force microscopy. He is a fellow of the American Physical Society.
Silicon nanowire sensors offer a route to improving the sensitivity and spatial resolution of magnetic resonance force microscopy.